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EE Times Pablo Valerio

Automakers Reconsider In-Cabin Sensing for Euro NCAP Ratings

Stricter European safety assessment criteria are prompting car companies to replace steering-wheel sensors with consolidated in-cabin systems. The post Automakers Reconsider In-Cabin Sensing for Euro NCAP Ratings appeared first on EE Times.

EE Times Aaron Fellis, corporate vice president and general manager, Wet Equipment Technology Systems, Lam Research

The AI Packaging Challenge: 5 Reasons Panels Are Gaining Momentum

As AI pushes chip packages beyond traditional wafer limits, panel-level processing is emerging as a critical path to scale advanced packaging. The post The AI Packaging Challenge: 5 Reasons Panels Are Gaining Momentum appeared first on EE Times.

EE Times Vasanth Sista, Field Application Engineer, TE Connectivity

Framing the Shift to 48V

From lighter wiring to automated assembly, 48V architectures are reshaping vehicle connectivity and laying the groundwork for next generation mobility. The post Framing the Shift to 48V appeared first on EE Times.

EE Times Ron Honig

In Orbit, Useful Life Becomes a Performance Metric

Google’s Project Suncatcher is testing AI hardware in space, where radiation, cooling, power, and hardware lifetime determine the economics of computing. The post In Orbit, Useful Life Becomes a Performance Metric appeared first on EE Times.

EE Times Pablo Valerio

Arm Comments on Jury Decision in Qualcomm Trial

Arm's Ami Badani cites the $2 nominal damages award as validation, while chip design experts point to open architectures such as RISC-V as the long-term alternative for AI workload flexibility. The post Arm Comments on Jury Decision in Qualcomm Trial appeared first on EE Times.

EE Times Moshe Zalcberg

Two Dollars and a Test Suite

The $2 damages award grabbed headlines, but the Arm-Qualcomm verdict’s bigger implication concerns who controls the compliance tests that custom chips must pass before shipping. The post Two Dollars and a Test Suite appeared first on EE Times.

EE Times Yashasvini Razdan

India’s OSAT Buildout Puts Semiconductor Testing in Focus

NI said Kaynes Semicon has selected its semiconductor test systems, while other Indian OSATs continue to evaluate equipment as manufacturers prepare for production. The post India’s OSAT Buildout Puts Semiconductor Testing in Focus appeared first on EE Times.

EE Times Surya Gunukula, Jerry Yicheng Wang, Kevin Zhang

Why Chip Design AI Benchmarks Must Go Beyond Functional Correctness

Demand for custom silicon is rising as physical AI, data centers, automotive systems, and edge devices require architectures optimized for specific workloads, memory bandwidth, latency, and energy efficiency. Delivering these designs requires teams to coordinate heterogeneous compute blocks, complex interconnects, and…